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Modern Microscopy on the Light Side: TEM in the Trenches

Published online by Cambridge University Press:  14 March 2018

Stephen E. Rice*
Affiliation:
McCrone Associates, Inc.

Extract

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Great strides have been made in the last decade in high resolution transmission electron microscopes (TEMs) which can also provide elemental information via energy dispersive X-ray analysis (EDX) or energy loss spectroscopy (EELS), and proponents of various TEM techniques make bold claims. Convergent beam elecjron diffraction and microdifff action shine as techniques for defect structure analysis and means for solving crystal structures. The spectroscopies can now be used to map chemical state information at a level which until recently might be encountered in science fiction. As a pure imaging device, electron holography holds great promise for providing Ehe ultimate (would you believe 0.1Å?) imaging resolution. Although conventional TEMs will never approach this, it appears that we are learning more and more about less and less, until we will soon know everything there is to know about nothing.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 1993