Hostname: page-component-cd9895bd7-7cvxr Total loading time: 0 Render date: 2024-12-24T16:15:35.639Z Has data issue: false hasContentIssue false

Microscopy and Microanalysis of Nano-Scale Materials

Published online by Cambridge University Press:  14 March 2018

J. R. Michael*
Affiliation:
Materials Science Center, Sandia National Laboratories, Albuquerque, NM
L. N. Brewer
Affiliation:
Materials Science Center, Sandia National Laboratories, Albuquerque, NM
D. C. Miller
Affiliation:
Materials Science Center, Sandia National Laboratories, Albuquerque, NM
K. R. Zavadil
Affiliation:
Materials Science Center, Sandia National Laboratories, Albuquerque, NM
S. V. Prasad
Affiliation:
Materials Science Center, Sandia National Laboratories, Albuquerque, NM
P. G. Kotula
Affiliation:
Materials Science Center, Sandia National Laboratories, Albuquerque, NM

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Material scientists and engineers continue to developmaterials and structures that are ever smaller. Some of this engineering is to simply domore with less while the science of nanomaterials allows new materials to be produced with a novel range of physical and chemical properties due to the small length scales of the microstructural features of thematerials. Currently, nanoscalematerials have been produced with a diverse set of useful properties and can be found in common substances like sunscreen or technologically advanced microelectronic devices. A complete understanding of materials is based on knowledge of the processing used to produce an interesting material coupled with a full characterization of the structure that results. It is this structure/property relationship that is the basis of understanding any newmaterial developed at all length scales.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2006

References

1. Handbook of Microscopy for Nanotechnology, eds.Yao, N. and Wang, Z. L., Kluwer Academic Publishers, New York, 2005.Google Scholar
2. Prasad, S.V. and Michael, J. R., “EBSD studies of wear-induced subsurface regions in LIGA nickel”, Scripta Mat.,2003, vol. 48, 255260.CrossRefGoogle Scholar
3. Zavadil, K. R., Ohlhausen, J. A. and Kotula, P. G., “Nanoscale void nucleation and growth in the passive oxide on aluminum as a prepitting process”, Journal of the Electrochemical Society, 2006, vol. 153, B296-B303.CrossRefGoogle Scholar
4. Zhu, Y., Moldovan, N. and Espinosa, H. D., “A micromechanical load sensor for in-situ electron and x-raymicroscopy tensile testing of nanostructures”, Applied Physics Letters, 2005, vol. 86, 013506-1-013506-3.Google Scholar
5. Pan, Wei Dunn, M.S. Carroll, et al., “Photoluminescence in silicon rich oxide thin films under different thermal treatments”, submitted to Applied Physics Letters, 2006 Google Scholar