When most of us use a microscope, we are looking through a specimen, or more and more frequently, at the “top” surface. It usually doesn't occur to us to look sideways. But that is what was done recently in the laboratory of Charles Lieber at Harvard University. As reported by Daniel Frisbie, Lawrence Rozsnyai, Aleksandr Nay, Mark Wrighton, and Prof, Lieber, an atomic force microscope (AFM) was modified to perform as a “chemical force microscope” (CFM). With the CFM they were able to precisely measure adhesive and frictional forces. These forces can be thought of as acting parallel to the surface of the specimen, whereas most observations are made perpendicular to the surface.