Free X-ray Transition Energies App for Your Smartphone or Tablet
The app includes elemental properties, X-ray transition energies, and reverse energy lookup. It permits a user to specify a transition energy value in keV and automatically determines and displays the elements and "lines" closest to this value. It also allows the user to select an element and displays its X-ray transition energies. Values are based on experimental values. Where experimental values are not available, the database uses theoretically derived values.
SGX Sensortech (MA) Limited
Michael Cyros Honored with 2014 AIA Achievement Award
Mike Cyros, chief commercial officer at Allied Vision Technologies, was presented with the 2014 AIA Achievement Award during a ceremony held at AIA’s 22nd Annual Business Conference. This prestigious award is the vision and imaging industry’s top leadership award. He is being honored for his long history of outstanding contributions to the vision and imaging industry at Allied Vision Technologies, as well as helping build AIA into the world’s largest vision trade association.
Allied Vision Technologies GmbH
XEI Scientific Appoints Eclipse Technologies as Distributors for the Northwest USA
Eclipse Technologies is a manufacturer's representative firm supporting the semiconductor, aerospace, bio/pharma, and energy industries within the Pacific Northwest of the USA. Eclipse is also positioned to take advantage of the current market expansion in the bioscience, pharmaceutical, and emerging technological sectors, which include nanotubes, micro-energy, micro-fluidic, chemical, and bio sensors.
XEI Scientific, Inc
FEI Buys Digital Rock Solutions Provider and microCT Product
FEI announced that it has acquired Lithicon AS of Trondheim, Norway, and Canberra, Australia. Lithicon provides leading-edge digital rock technology services and pore-scale micro computed tomography (µCT, or microCT) equipment to oil and gas companies worldwide. In conjunction with the acquisition, FEI has obtained the helical scan microCT product and associated software from the Australian National University (ANU) through a licensing and development agreement.
FEI Company
ZEISS Grants License for LED Fluorescence Excitation to Lumencor, Inc.
ZEISS has granted a license for patents relating to LED fluorescence excitation in microscopy to Lumencor, Inc. These patents protect the use of light emitting diodes for the excitation of fluorescence radiation in light microscopes. ZEISS uses this technology in a number of products, such as iLED-module, Axio Scope with integrated LED illumination for fluorescence applications, and Colibri.2 for a wide range of applications extending from routine to high-end microscopy.
ZEISS, Microscopy
Thin-Film Thickness Measurements of Sub-Micron Sampling Areas from CRAIC Technologies
CRAIC Technologies introduces CRAIC FilmPro™ film-thickness measurement software. This software package is designed to plug in to CRAIC Technology’s microspectrophotometers and their controlling Lambdafire™ software. CRAIC FilmPro™ enables the user to determine thin-film thickness on everything from semiconductors, MEMS devices, and disk drives to flat-panel displays. This powerful and flexible software can be used in many different fields and in everything from research to industrial settings.
CRAIC Technologies, Inc.
Making Scientific Images Publication-Ready
Publication images in scientific journals often look nothing like the originals. Imaging & Analysis, LLC (I&A) is on a mission to do something about it. They’ve just released a new mini library of I&A Photoshop Add-ons™ for automating many common prepress image prep procedures, as well as a series of “how-to” videos posted on YouTube and their own website, quickphotoshop.com, to demonstrate novel approaches using Photoshop to correct these images.
Image & Analysis, LLC
Andor Technology Joins Oxford Instruments to Drive Growth
Oxford Instruments acquired Andor, a supplier of high-performance cameras, microscope systems, and software for the physical science and life science industries. Andor will continue to focus on growing their existing core markets and will spearhead Oxford Instruments strategic expansion into the Nano-Bio arena. For Andor, joining the group means increased investment in R&D, expansion of its product range, and the opportunity to broaden its reach into new markets and applications.
Oxford Instruments plc and Andor Technology
Samuel Sadoulet Named President of Edmund Optics
Edmund Optics®, the premier provider of optical components, announces the appointment of Samuel Sadoulet as president. Mr. Sadoulet, who has filled the role of chief operating officer for more than a year, will also retain that title as he continues to lead the company’s corporate technology, global engineering, and manufacturing operations. Robert Edmund, CEO, stated that Mr. Sadoulet will reinforce Edmund Optics’s core focus on service.
Edmund Optics
TESCAN Announces the Automated Loading System for TIMA
TESCAN, building on the success of its TIMA scanning electron microscope mineralogy analyzer, announced today the introduction of the TIMA with the Automated Loading System (AutoLoader). The TIMA equipped with AutoLoader is the first fully automated mineral analyzer to permit robust, continuous, and unattended sample loading. This newly pioneered design delivers unprecedented high throughput analysis, allowing accommodation of up to 100 epoxy blocks of 25 mm or 30 mm diameter at one time.
TESCAN USA
SEM Remote Diagnostics and SEM Lab Web Analysis
Recently, SEMTech Solutions has implemented a remote SEM diagnostics package for our refurbished SEMs. If your SEM is Win7TM-compliant and you are under a service contract, we will load this onto your SEM with your permission at no charge. This will help save on time to debug any system issue before a service person comes on-site. We can upgrade those not having a Win7-compliant SEM or those not under contract.
SEMTech Solutions, Inc.
Simon Fraser University Completes Installation of Electron Microscopes from FEI
FEI announced that it has completed the installation of a suite of high-end electron microscopes at Simon Fraser University’s (SFU) new Centre for Soft Materials. The systems installed include the Tecnai Osiris™ transmission electron microscope (TEM) and Helios™ DualBeam™ (scanning electron microscope/focused ion beam). These systems join several other FEI microscopes in the 4D LABS facility, Vancouver, British Columbia, where the new, multi-million dollar center is housed.
FEI Company
TECHSPEC® Barium Fluoride Windows Provide High Transmission without AR Coatings
Edmund Optics® introduced TECHSPEC BaF2 Windows. These windows are ideal for use in a wide variety of applications, including infrared spectroscopy, as they offer wide broadband transmission extending from the deep ultraviolet to the long-wave IR. With excellent transmission from 200 nm to 14 μm, TECHSPEC BaF2 windows take advantage of barium fluoride’s low index of refraction (1.48), which provides high transmission without the need for anti-reflection (AR) coatings.
Edmund Optics
attocube systems AG Acquires the Majority Holding in Neaspec GmbH
Munich-based nanotechnology specialist attocube took over the majority share in Neaspec GmbH, a company specializing in the development of scanning near-field optical microscopes (SNOM). These microscopes break the resolution limit of conventional existing optical microscopes and therefore open up completely new applications for nanoanalytical characterization. attocube, specializing in the cryogenic microscopy market, will profit from the cooperation by expanding their portfolio with further-elaborated measurement techniques in nanotechnology
attocube systems AG and Neaspec GmbH
Olympus Partners with Educational Institution Network of the Université du Québec
Olympus has become a Research Partner with École de Technologie Supérieure (ÉTS), part of the Université du Québec network. The partnership will provide ÉTS with new and innovative metrology and microscopy analysis solutions. ÉTS specializes in application engineering and technology and is geared toward co-operative education with a particular focus on fields such as mechanical, electrical, civil, production, industrial engineering, and material sciences.
Olympus Corporation
Park Systems New Atomic Force Microscope Technology Surpasses Old Standards for Semiconductor Failure Analysis Detection
Park Systems announced PinPoint Conductive AFM, an extremely accurate conductive measurement technology at nano-scale resolution for failure analysis (FA) in the semiconductor industry. The newly designed and innovative Park Systems PinPoint iAFM effectively solves the issues of traditional AFM, thereby providing the an optimum, lower-cost solution to the FA engineers’ needs in nanotechnology.
Park Systems
