Published online by Cambridge University Press: 14 March 2018
Nano-TA is a local thermal analysis technique that combines the high spatial resolution imaging capabilities of atomic force microscopy (AFM) with the ability to obtain understanding of the thermal behaviour of materials with a spatial resolution of sub-100nm. This breakthrough in spatial resolution of thermal analysis, which is ~50× better than previously reported, has profound implications for the fields of polymers and pharmaceuticals where local thermal understanding is key.
The conventional AFM tip is replaced by a special nano-TA probe that has an embedded miniature heater and is controlled by the specially designed nano-TA hardware and software. The nano-TA probe enables a surface to be visualised at nanoscale resolution using the routine imaging modes of AFM. The user is able to select the spatial locations for the investigation of the thermal properties of the surface. Heat is supplied locally via the probe tip and the thermomechanical response is measured.