Hostname: page-component-78c5997874-fbnjt Total loading time: 0 Render date: 2024-11-19T08:36:29.237Z Has data issue: false hasContentIssue false
  • English
  • Français

High-Resolution Imaging with Atomic Force Microscopy

Published online by Cambridge University Press:  14 March 2018

Sergei Magonov
Sergei Magonov*
Affiliation:
Veeco Instruments Inc., Santa Barbara, CA

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

The invention of scanning tunneling microscopy (STM) in 1982 revolutionized surface analysis by providing atomic-scale surface imaging of conducting and semiconducting materials. Shortly after that, atomic force microscopy (AFM) was introduced as an accessory of STM for high-resolution imaging of surfaces independent of their conductivity. Mechanical force interactions between a sharp tip placed at one end of a micro fabricated cantilever and a sample surface were employed for imaging in this method. In the past decade, AFM has developed into a leading scanning probe technique applied in many fields of fundamental and industrial research. The progress of AFM has been made possible by implementation of an optical level detection scheme, which allows precise measuring of the cantilever deflection caused by the tip-sample forces, by mass microfabrication of probes consisting of cantilevers, and by developments of oscillatory imaging modes, particularly, Tapping ModeTM.

Type
Research Article
Information
Microscopy Today , Volume 12 , Issue 5 , September 2004 , pp. 12 - 15
Copyright
Copyright © Microscopy Society of America 2004

References

1. Binnig, G., Rohrer, H., Gerber, Ch. and Weibel, E., Phys. Rev. Lett. 49 (1982), 57.Google Scholar
2. Binnig, G., Quate, C. and Gerber, Ch., Phys. Rev. Lett. 56 (1986), 930.CrossRefGoogle Scholar
3. Alexander, S., Hellemans, L., Marti, O., Schneir, J., Elings, V., Hansma, P. K., Longmire, M. and Gurley, J., J. Appl. Phys. 65 (1989), 164.Google Scholar
4. Zhong, Q., innis, D., Kjolier, K. and Elings, V. B. Surf. Sci. Let. 290 (1993) L688Google Scholar
5. Magonov, S. N. and Whangbo, M.-H., Surface Analysis with STM and AFM, VCH, Weinhdm (1996).Google Scholar
6. Landman, U., Luedke, W. D. and Nitzan, A., Surf. Sci. Lett. 10 (1989), L177.Google Scholar
7. Giessibl, F.J., Science 267 (1995), 68.Google Scholar
8. The diamond probes tire made by S. Mesa, MicroStar Technology, Huntsville, TX, USA, http://www.microstartech.com. Google Scholar
9. Klinov, D. and Magonov, S., Appl. Phys. Lett. 84 (2004). 2697.Google Scholar
10.Sample is courtesy of Prof. V, Percec (UPenn. Philadelphia)Google Scholar
11. Magonov, S. N., “AFM in Analysis ot Polymers” Encyclopedia of Analytical Chemistry, (R. A. Meyers, Ed.), pp. 7432-7491, John Willey & Sons Ltd, Chichester, 2000.Google Scholar
12. Magonov, S. N., Yerina, N. A., Ungar, G. and Ivanov, D., in preparationGoogle Scholar