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Guidance for Choosing When to Use Electron and/or Light Microscopy and Related ASTM E4 Standards

Published online by Cambridge University Press:  14 March 2018

R. C. Nester
R. C. Nester*
Affiliation:
International Steel Group, ISG Research
*
[email protected]

Extract

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Technical publications sometimes include scanning electron images to characterize a microstructure, when the relevant structure could have very easily been illustrated using a simple light micrograph. When should one use a light generated image? What are the advantages/disadvantages of an electron generated image, particularly; one generated using a scanning electron microscope (SEM)? While there is some overlap in the capabilities of these imaging systems; in general, they are complementary tools, each with their own uses. Standards under the jurisdiction of ASTM Committee E4 on Metallography offer guidance to both new and experienced users of both investigative techniques.

Type
Research Article
Information
Microscopy Today , Volume 12 , Issue 2 , March 2004 , pp. 26 - 27
Copyright
Copyright © Microscopy Society of America 2004

References

[1]Annual Book of ASTM Standards, American Society for Testing and Materials International, Volume 03.01, W. Conshohocken, PA, 2002.Google Scholar
[2] Watt, I. M., The Principles and Practice of Electron Microscopy, Cambridge University Press, Cambridge, 1985.Google Scholar