Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-19T08:21:19.863Z Has data issue: false hasContentIssue false
  • English
  • Français

Fast Orientation Imaging Microscropy

Published online by Cambridge University Press:  14 March 2018

David J. Dingley ,
Stuart Wright  and
Mathew Nowell
David J. Dingley*
Affiliation:
TSL (a subsidiary of EDAX)
Stuart Wright
Affiliation:
TSL (a subsidiary of EDAX)
Mathew Nowell
Affiliation:
TSL (a subsidiary of EDAX)
*
*[email protected]

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Orientation Imaging Microscopy is currently the most rapidly growing combined metallographic and crystallographic technique today. The first OIM was recorded by Wright in 1991, and published soon after, Adams et al. (1993). The technique is based on the original works on Electron Backscatter Diffraction (EBSD) by Venables and Hariand (1973), and Dingiey (1984, 1987). By 1994 some number of papers on the subject had been published. At the time of writing the authors are aware of over 600 publications that have utilized the technique and there are in excess of 400 systems in use worldwide.

Type
Research Article
Information
Microscopy Today , Volume 10 , Issue 3 , May 2002 , pp. 10 - 14
Copyright
Copyright © Microscopy Society of America 2002

References

Adams, B. L., Wright, S. I., et al. (1993). “Orientation Imaging: The Emergence of a New Microscopy.” Metallurgical Transactions A - Physical Metallurgy and Materials Science 24(4): 819–831.Google Scholar
Baba-Kishi, K. Z. and Dingley, D. J. (1987). “Application of Backscatter Kikucht Diffraction in the SEM to Studies of NiS,” Journal of Applied Crystallography 22: 89–98.Google Scholar
Dingley, D. J. (1984), On-line determination of crystal orientation and texture determination in an SEM, Proceedings of the Royal Microscopic Society. 19 74–75.Google Scholar
Dingley, D. J., Longdon, M., et al. (1987). “On-line Analysis of Electron Backscatter Diffraction Patterns, Texture Analysis of Polysilicon.” Scanning Electron Microscopy 1(2): 451–456.Google Scholar
Field, D. P. (1997), “Recent advances in the application of orientation imaging.” Ultramicroscopy 67(1-4): 1–9.Google Scholar
Krieger Lassen, N. C., Conradsen, K., et al. (1992). “Image Processing Procedures for Analysis of Electron Back Scattering Patterns.” Scanning Microscopy 6(1): 115–121.Google Scholar
Michael, J. R. and Goehner, R. P. (1993). “Crystallographlc Phase Identification in the Scanning Electron Microscope: Backscattered electron Kikuchi Patterns Imaged with a CCD-based Detector.” Microscopy Society of America Bulletin 23: 168.Google Scholar
Venables, J. A. and Harland, C. J. (1973). “Electron Back-Scattering Patterns – A New Technique for obtaining Crystallographic Information in the Scanning Electron Microscope.” Philosophical Magazine 2(7): 1193–1200.Google Scholar