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Environmental Contamination Sources and Control in High Resolution Scanning Electron Microscopy

Published online by Cambridge University Press:  14 March 2018

Ronald Vane*
Affiliation:
XEI Scientific, Redwood City, CA
Vince Carlino
Affiliation:
XEI Scientific, Redwood City, CA

Extract

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Traditionally, contamination control in SEMs has focused on pump oils, finger prints, dirty specimens, and good vacuum practice in manufacturing. Now, the use of dry pumps at all stages of the vacuum system of new FE SEMs, and the use of better vacuum practices on the part on users and manufacturers have made environmental hydrocarbons, the hydrocarbon background contamination of our world, a significant source of the remaining hydrocarbons in electron microscope vacuum systems. These environment sources of hydrocarbons (HC) cause a loss of resolution and contrast in imaging at the highest levels of magnification.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2006

References

References:

[1] Vladár, András E., Postek, Michael T. and Vane*, Ronald, “Active Monitoring and Control of Electron Beam Induced ContaminationProc. SPIE Vol. 4344 (2001), 835.Google Scholar