Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-23T11:34:05.974Z Has data issue: false hasContentIssue false
  • English
  • Français

The Effect of Instrumental Uncertainties on AFM Indentation Measurements

Published online by Cambridge University Press:  14 March 2018

Mark VanLandingham
Mark VanLandingham*
Affiliation:
Center for Composite Materials, University of Delaware

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

The accuracy and precision of the quantitative measurements made with various types of scanning probe microscopes (SPMs) can be limited by instrumentation error. The piezoelectric scanners that are utilized in SPMs control either the motion of the cantilever probe with respect to a stationary sample or the motion of the sample with respect to a stationary probe. While these scanners offer many advantageous characteristics that are critical to the performance of SPMs, they also exhibit several behaviors, e.g., hysteresis and creep, that introduce uncertainties in measurements. Also, the nonlinearities associated with the photodiode used in the optical lever detection system can detract from the accuracy of measurements

Type
Research Article
Information
Microscopy Today , Volume 5 , Issue 10 , December 1997 , pp. 12 - 15
Copyright
Copyright © Microscopy Society of America 1997

References

1. VanLandingham, M.R., McKnigrit, S.H., Palmese, G.R., Eduijee, R.F., Gillespie, J.W. Jr., and McCullough, R.L, J. Mater. Sci. Lett., 16, 117–119 (1997).CrossRefGoogle Scholar
2. VanLandingham, M.R., McKnigrit, S.H., Palmese, G.R., Bogetti, T.A., Eduijee, R.F., and Gillespie, J.W. Jr., in Materials Research Society Proceedings, 458, Pittsburgh, PA, 1997, pp.313–313.Google Scholar
3. VanLandingham, M.R., McKnigrit, S.H., Palmese, G, Elings, J. R., Huang, X., Bogetti, T.A., Eduijee, R.F., and Gillespie, J.W. Jr., J, Adhesion. 64, 31–59 (1997).CrossRefGoogle Scholar
4. Hues, S.M., Colton, R.J., Meyer, E., and Gunttierodt, H.-J., MRS Bulletin, 18, 41–49 (1993).Google Scholar
5. Howland, R. and Benatar, L, “A Practical Guide to Scanning Probe Microscopy,” Park Scientific Instruments, Sunnyvale, CA, 1996.Google Scholar
6. Cleveland, J.P., Digital Instruments, Santa Barbara, CA, personal communication, 1996.Google Scholar
7. Elings, J.R., Support Note Mo.225, Digital Instruments, Santa Barbara, CA, 1996.Google Scholar