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The Development of an X-ray Spectral Database for Forensic Science
Published online by Cambridge University Press: 14 March 2018
Extract
The Scanning Electron Microscope (SEM) with associated Energy Dispersive Spectrometer (EDS) is commonly used to characterize the structure and elemental composition of a wide variety of materials of forensic significance. When these materials are extremely limited in size, SEM/EDS is often the only suitable method for characterization available in forensic science laboratories.
Because of the inability to access SEM/EDS data from large numbers of materials, the Federal Bureau of Investigation (FBI) laboratory believes that this discipline has not realized its full potential. The usefulness of SEM/EDS has been limited by the inability to archive spectra within a utility having a true database architecture. The FBI Laboratory has designed such an X-ray database, consisting of storage, query, and display utilities unique to X-ray spectroscopy.
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- Research Article
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- Copyright
- Copyright © Microscopy Society of America 2001
References
1. The Particle Atlas, Edition Two, McCrone W.C., Delly J.G., Ann Arbor Science Publishers, Inc, 1973
2. xk, Inc, www.xk.com