The increasing availability of the user-friendly black box can present an increased probability of characterization errors. The uninformed choice (e.g., any SEM will see this) or dependence on one instrument can also lead to erroneous results. Failure to understand the limits and advantages of a particular instrument and bias through assumption or desired result can be equally deceptive.

In the example presented here, the objectives are to determine primary particle size and to identify the impurities in a specimen. We will look at the data produced by several instruments and discuss the ways each technology can support or mislead the analysts.

Images were acquired optically by secondary electron (SE), x-ray dot maps and back scattering electrons (BSE). The elemental analysis techniques used were Energy Dispersive Spectrometry (EDS), Wavelength Dispersive Spectrometry (WDS) and Powder x-ray diffractometry (PXD).

Field emission SEM (FESEM) and optical images are used.