Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-19T06:24:51.764Z Has data issue: false hasContentIssue false
  • English
  • Français

Applications for Automated Particle Analysis

Published online by Cambridge University Press:  14 March 2018

Robert Anderhalt  and
Lara Swenson
Robert Anderhalt*
Affiliation:
EDAX Inc., Mahwah, NJ
Lara Swenson
Affiliation:
EDAX Inc., Mahwah, NJ
*
[email protected]

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Electron microscopy and x-ray microanalysis are common techniques in many research, development and quality labs (Garratt-Reed and Bell, 2002; Goldstein et al., 2003). As systems become ever more automated, as well as easy to use, new applications for the use of these systems develop and expand. One such application is particle analysis. These “particles” might be small loose fragments that can be applied to a conductive adhesive or a filter, embedded in epoxy and polished, or they can be inclusions within collect an EDS spectrum.

Type
Research Article
Information
Microscopy Today , Volume 14 , Issue 5 , September 2006 , pp. 22 - 27
Copyright
Copyright © Microscopy Society of America 2006

References

Garratt-Reed, A.J. and Bell, D.C., Energy Dispersive X-Ray Analysis in the Electron Microscope, (Springer-Verlag NewYork, Inc., 2002).Google Scholar
Goldstein, J., Newbury, D., Joy, D., Lyman, C., Echlin, P., Lifshin, E., Sawyer, L., and Michael, J., Scanning Electron Microscopy and X-ray Microanalysis, 3rd edition (Kluwer Academic Plenum Press, New York, 2003).Google Scholar
Laskin, A., and Cowin, J.P., 2001, Automated single-particle SEM/EDXanalysis of submicrometer particles down to 0.1 μm, Anal. Chem., vol. 73, p.1023–1029.Google Scholar
Laskin, A., Cowin, J.P., and Iedema, M.J., 2006, Analysis of individual environmental particles using modern methods of electron microscopy and X-raymicroanalysis, Journal of Electron Spectroscopy and Related Phenomena, vol. 2-3, p. 260–274.CrossRefGoogle Scholar