Microscopy and Microanalysis: Volume 3 - Issue 5

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Volume 3 - Issue 5 - September 1997

Contents

Research Article

High Resolution Electron Microscopy In Situ Observation of Dynamic Behavior of Grain Boundaries and Interfaces at Very High Temperatures
T. Kamino, K. Sasaki, H. Saka
Published online by Cambridge University Press:

31 January 2003, pp. 393-408
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High Resolution Electron Microscopy In Situ Observation of Dynamic Behavior of Grain Boundaries and Interfaces at Very High Temperatures

In Situ Transmission Electron Microscopy Observations of Alloying of Nanoscale Pb Inclusions by Implantation with Cd Ions
E. Johnson, U. Dahmen
Published online by Cambridge University Press:

31 January 2003, pp. 409-416
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In Situ Transmission Electron Microscopy Observations of Alloying of Nanoscale Pb Inclusions by Implantation with Cd Ions

Segregation of Bismuth to Triple Junctions in Copper
K.-M. Yin, A.H. King, T.E. Hsieh, F.-R. Chen, J.J. Kai, L. Chang
Published online by Cambridge University Press:

31 January 2003, pp. 417-422
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Segregation of Bismuth to Triple Junctions in Copper

Structural Characterizations of Bi2Sr2CaCu2O8+δ Twist Boundaries Using Advanced Transmission Electron Microscopy
Yimei Zhu, L. Wu, J.-Y. Wang, Q. Li, Y.N. Tsay, M. Suenaga
Published online by Cambridge University Press:

31 January 2003, pp. 423-435
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Structural Characterizations of Bi2Sr2CaCu2O8FATAL ERROR -- Missing abstract.plus;FATAL ERROR -- Missing abstract.dgr; Twist Boundaries Using Advanced Transmission Electron Microscopy

Convergent Beam Electron Diffraction and Transmission Electron Microscopy Study of Interfacial Defects in Gallium Nitride Homoepitaxial Films
Z. Liliental-Weber, Jack Washburn, K. Pakula, J. Baranowski
Published online by Cambridge University Press:

31 January 2003, pp. 436-442
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Convergent Beam Electron Diffraction and Transmission Electron Microscopy Study of Interfacial Defects in Gallium Nitride Homoepitaxial Films

Structure and Bonding at Ni–ZrO2 (Cubic) Interfaces Formed by the Reduction of a NiO–ZrO2 (Cubic) Composite
E.C. Dickey, V.P. Dravid, P.D. Nellist, D.J. Wallis, S.J. Pennycook, A. Revcolevschi
Published online by Cambridge University Press:

31 January 2003, pp. 443-450
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Structure and Bonding at NiFATAL ERROR -- Missing abstract.ndash;ZrO2 (Cubic) Interfaces Formed by the Reduction of a NiOFATAL ERROR -- Missing abstract.ndash;ZrO2 (Cubic) Composite

Analysis of Experimental Error in High Resolution Electron Micrographs
Geoffrey H. Campbell, Wayne E. King, Dov Cohen
Published online by Cambridge University Press:

31 January 2003, pp. 451-457
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Analysis of Experimental Error in High Resolution Electron Micrographs

Other

News and Commentary
Published online by Cambridge University Press:

31 January 2003, pp. 458-473
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Microscopy and Microanalysis

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Volume 3 - Issue 5 - September 1997

Research Article

High Resolution Electron Microscopy In Situ Observation of Dynamic Behavior of Grain Boundaries and Interfaces at Very High Temperatures

In Situ Transmission Electron Microscopy Observations of Alloying of Nanoscale Pb Inclusions by Implantation with Cd Ions

Segregation of Bismuth to Triple Junctions in Copper

Structural Characterizations of Bi2Sr2CaCu2O8+δ Twist Boundaries Using Advanced Transmission Electron Microscopy

Convergent Beam Electron Diffraction and Transmission Electron Microscopy Study of Interfacial Defects in Gallium Nitride Homoepitaxial Films

Structure and Bonding at Ni–ZrO2 (Cubic) Interfaces Formed by the Reduction of a NiO–ZrO2 (Cubic) Composite

Analysis of Experimental Error in High Resolution Electron Micrographs

Other

News and Commentary

Microscopy and Microanalysis

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Volume 3 - Issue 5 - September 1997

Research Article

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