Hostname: page-component-78c5997874-j824f Total loading time: 0 Render date: 2024-11-19T06:55:38.140Z Has data issue: false hasContentIssue false
  • English
  • Français

Z-Contrast Imaging of Dislocation Cores at the Si/GaAs Interface

Published online by Cambridge University Press:  01 August 2002

S. Lopatin ,
J. Narayan  and
G. Duscher
S. Lopatin
Affiliation:
Department of Materials Science and Engineering, NC State University, Raleigh NC 27695
J. Narayan
Affiliation:
Department of Materials Science and Engineering, NC State University, Raleigh NC 27695
G. Duscher
Affiliation:
Department of Materials Science and Engineering, NC State University, Raleigh NC 27695 Oak Ridge National Laboratory, Oak Ridge, TN 37831

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1604 - 1605
Copyright
Copyright © Microscopy Society of America 2002