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Z-Contrast Imaging in the Scanning Transmission Electron Microscope

Published online by Cambridge University Press:  08 August 2003

S.J. Pennycook ,
D.E. Jesson ,
M.F. Chisholm ,
N.D. Browning ,
A.J. McGibbon  and
M.M. McGibbon
S.J. Pennycook
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6030
D.E. Jesson
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6030
M.F. Chisholm
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6030
N.D. Browning
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6030
A.J. McGibbon
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6030
M.M. McGibbon
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6030
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Abstract

Z-contrast STEM using an annular detector can provide an intuitively interpretable, column-by-column, compositional map of crystals. Incoherent imaging reduces dynamical effects to second order so that the map directly reflects the positions of the atomic columns and their relative high-angle scattering power. This article outlines how these characteristics arise, presents some examples of the insights available from a direct image, and discusses recent developments of atomic-resolution microanalysis, direct structure retrieval by maximum entropy analysis, and Z-contrast imaging at 1.4 Å resolution using a 300-kV STEM.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 1 , Issue 6 , December 1995 , pp. 231 - 251
Copyright
© 1995 Microscopy Society of America

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