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XUtils Ver. 1: A Set of Gatan DigitalMicrograph Plug-ins for Characterization of XEDS-Detector Performance Parameters in an AEM

Published online by Cambridge University Press:  01 August 2010

M Watanabe
M Watanabe
Affiliation:
Lehigh University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 260 - 261
Copyright
Copyright © Microscopy Society of America 2010