Hostname: page-component-78c5997874-dh8gc Total loading time: 0 Render date: 2024-11-19T22:59:04.716Z Has data issue: false hasContentIssue false
  • English
  • Français

X-ray Microanalysis of Insulators in a Variable Pressure Environment

Published online by Cambridge University Press:  01 August 2002

M. Toth ,
J.P. Craven ,
M.R. Phillips ,
B.L. Thiel  and
A.M. Donald
M. Toth
Affiliation:
Polymers and Colloids Group, Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge, CB3 0HE, U.K.
J.P. Craven
Affiliation:
Polymers and Colloids Group, Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge, CB3 0HE, U.K.
M.R. Phillips
Affiliation:
Microstructural Analysis Unit, University of Technology Sydney, Broadway, NSW 2007, Australia
B.L. Thiel
Affiliation:
Polymers and Colloids Group, Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge, CB3 0HE, U.K.
A.M. Donald
Affiliation:
Polymers and Colloids Group, Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge, CB3 0HE, U.K.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1478 - 1479
Copyright
Copyright © Microscopy Society of America 2002