Hostname: page-component-7bb8b95d7b-pwrkn Total loading time: 0 Render date: 2024-10-06T08:50:53.964Z Has data issue: false hasContentIssue false
  • English
  • Français

X-Ray Analysis Of Rough Surfaces At Low Energy

Published online by Cambridge University Press:  01 August 2002

Pierre Hovington ,
Marin Lagacé  and
Lisa Rodrigue
Pierre Hovington
Affiliation:
Hydro-Québec Research Institut, 1800 Boul. Lionel-Boulet, Varennes, Québec, J3X 1S1, Canada
Marin Lagacé
Affiliation:
Hydro-Québec Research Institut, 1800 Boul. Lionel-Boulet, Varennes, Québec, J3X 1S1, Canada
Lisa Rodrigue
Affiliation:
Hydro-Québec Research Institut, 1800 Boul. Lionel-Boulet, Varennes, Québec, J3X 1S1, Canada

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1472 - 1473
Copyright
Copyright © Microscopy Society of America 2002