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X-ray Analysis in the AEM with Angstrom-Level Spatial Resolution and Single-Atom Detection

Published online by Cambridge University Press:  01 August 2005

M Watanabe  and
D B Williams
M Watanabe
Affiliation:
Lehigh University, Bethlehem, Pennsylvania
D B Williams
Affiliation:
Lehigh University, Bethlehem, Pennsylvania

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1362 - 1363
Copyright
© 2005 Microscopy Society of America