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XEDS in the AEM: Has Everything Thing That Can be Invented, Been Invented?

Published online by Cambridge University Press:  27 August 2014

Nestor J. Zaluzec
Nestor J. Zaluzec*
Affiliation:
Electron Microscopy Center, Argonne National Laboratory, Argonne Il, 60439 USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 564 - 565
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Punch Almanack “The Coming Century” 116 Dec. (1899) – Harvard Library Collection.Google Scholar
[2] Duell, C.H. U.S. Patent Office, Official Gazette 90, No. 9 (1900) pg 1752.Google Scholar
[3] Sass, Samuel Skeptical Inquirer 13 (1989) 310-313.Google Scholar
[4] see Multiple Symposia in M&M (2014 – Hartford, Microsc. Microanal. 20 S2 these proceedings.Google Scholar
[5] Castaing, R. Thesis, Univ. Paris (1951).Google Scholar
[6] Fitzgerald, R., Keil, К., Heinrich, KFJ. Science Vol 159, ρ 528 (1968).Google Scholar
[7] Lorimer, G., Razik, N.A., Cliff, G. J. Microscopy 99, #2, 153-164 (1972).Google Scholar
[8] Gatti, E. Rehak p.;, Nuci. Instr. and Meth. A 225 (1984, pp. 608-614.Google Scholar
[9] Lyman, C.E., Goldstein, J.I., Williams, D.B, Ackland, D.W., von Harrach, S., Nicholls, A.W.; and Statham, P.J., J. Microscopy 176 85-98 (1994).Google Scholar
[10] von Harrach, H.S., Dona, P. Freitag, В.; Soltau, H.; Niculae, A.; and Rohde, M.; Microsc Microanal 15, S2, 208-9 (2009).Google Scholar
[11] Zaluzec, N.J Microsc. Microanal. 15, 93–98 ( 2009). doi:10.1017/S1431927609090217, also see Zaluzec 2014 (in press) http://tpm.amc.anl.gov/NJZTools.Google Scholar
[12] Zaluzec, N.J. 9th Int. Congress on Electron Microscopy, Toronto 1 (1978) 548-549.Google Scholar
[13] Zaluzec, N.J., Kenik, E.A., Bentley, J. Report of a Specialist Workshop on Analytical Electron Microscopy Ithaca N.Y (1978) ρ 179–182.Google Scholar
[14] Zaluzec, N.J. Microsc. Microanal. 18 (Suppl 2 (2012, 678-679, doi:10.1017/S1431927612005247.Google Scholar
[15] This work was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357 at the Electron Microscopy Center of Argonne National Laboratory.Google Scholar