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Wide Dynamic Range, 10 kHz Framing Detector for 4D-STEM

Published online by Cambridge University Press:  30 July 2021

Hugh Philipp ,
Mark Tate ,
Katherine Shanks ,
Luigi Mele ,
Maurice Peemen ,
Pleun Dona ,
Reinout Hartong ,
Gerard van Veen ,
Yu-Tsun Shao  and
Sol Gruner
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Hugh Philipp
Affiliation:
Laboratory of Atomic and Solid State Physics (LASSP), Cornell University, Ithaca, NY, USA, Ithaca, New York, United States
Mark Tate
Affiliation:
Laboratory of Atomic and Solid State Physics (LASSP), Cornell University, Ithaca, NY, USA, ITHACA, New York, United States
Katherine Shanks
Affiliation:
Laboratory of Atomic and Solid State Physics (LASSP), Cornell University, Ithaca, NY, USA, United States
Luigi Mele
Affiliation:
Materials and Structural Analysis Division, Thermo Fisher Scientific, Achtseweg Noord, Eindhoven, 5651 GG, Netherlands, Netherlands
Maurice Peemen
Affiliation:
R&D Laboratory, Thermo-Fisher Scientific, Netherlands
Pleun Dona
Affiliation:
R&D Laboratory, Thermo-Fisher Scientific, Netherlands
Reinout Hartong
Affiliation:
R&D Laboratory, Thermo-Fisher Scientific, Netherlands
Gerard van Veen
Affiliation:
R&D Laboratory, Thermo-Fisher Scientific, Netherlands
Yu-Tsun Shao
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, Ithac, New York, United States
Sol Gruner
Affiliation:
Laboratory of Atomic and Solid State Physics (LASSP), Cornell University, Ithaca, NY, USA, United States
Julia Thom-Levy
Affiliation:
Laboratory for Elementary-Particle Physics (LEPP), Cornell University, Ithaca, NY, USA, United States
David Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, Ithaca, New York, United States

Abstract

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Type
Diffraction Imaging Across Disciplines
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 992 - 993
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Ophus, C., Microscopy and Microanalysis 25, (2019): 1–20.Google Scholar
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Padgett, E., Ultramicroscopy 214, (2020): 112994CrossRefGoogle Scholar
Chen, Z. et al. , arXiv:2101.00465. (2021). https://arxiv.org/abs/2101.00465Google Scholar