Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-27T04:46:03.613Z Has data issue: false hasContentIssue false
  • English
  • Français

Whisker Formation and Stress Relaxation in Tin Thin Films

Published online by Cambridge University Press:  08 April 2017

P Sarobol ,
A Pedigo ,
J Koppes ,
Y Wang ,
W Chen ,
P Su ,
J Blendell  and
C Handwerker
P Sarobol
Affiliation:
Purdue University
A Pedigo
Affiliation:
Purdue University
J Koppes
Affiliation:
Purdue University
Y Wang
Affiliation:
Purdue University
W Chen
Affiliation:
Purdue University
P Su
Affiliation:
Cisco Systems
J Blendell
Affiliation:
Purdue University
C Handwerker
Affiliation:
Purdue University

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1846 - 1847
Copyright
Copyright © Microscopy Society of America 2011