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What's Still Missing with the Fluorescence Corrections and Should We Care?

Published online by Cambridge University Press:  27 August 2014

John T. Armstrong  and
John J. Donovan
John T. Armstrong
Affiliation:
Geophysical Laboratory, Carnegie Institution of Washington, Washington, DC, USA.
John J. Donovan
Affiliation:
CAMCOR, University of Oregon, Eugene, OR, USA.

Abstract

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Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 726 - 727
Copyright
Copyright © Microscopy Society of America 2014 

References

[I] Reed, S.J.B., Brit, J. Appl. Phys. 16.1965) 913-926.Google Scholar
[2] Reed, S.J.B. “Electron Microprobe Analysis”, 2nd Ed., Cambridge Univ. Press (1993) 242-268.Google Scholar
[3] Armstrong, J.T. Microbeam Analysis (1988), 239-246.Google Scholar
[4] Armstrong, J.T., Buseck, P.R. X-ray Spectrom. 14 (1985) 172-182.Google Scholar
[5] Schiebl, C., August, H.J., Wernisch, J. Micros. Microanal. Microstruct. 2 (1991) 413-423.Google Scholar
[6] Cox, M.G.C., Love, G., Scott, V.D. J. Phys. D 12 (1979) 1441-1450.Google Scholar
[7] Demers, H., Gauvin, R. Micros. Microanal. 13 (Suppl. 2) (2007, 1392 CD.Google Scholar
[8] Llovet, X., Valovirta, E., Heikinheimo, E. Mikrochim. Acta 132 (2000) 205-212.Google Scholar
[9] Ritchie, N. Micros. Today (2011) 26-31.Google Scholar
[10] Gauvin, R., Lifshin, E., Demers, H., Horny, P., Campbell, H. Micros. Microanal. 12 (2006) 49-64.Google Scholar
[II] Fournelle, J.H., Kim, S., Perepezko, J.H. Surf. Interface Sci. 37 (2005) 1012-1016.Google Scholar
[12] Armstrong, J.T., Donovan, J.J., Carpenter, P.C. Microscopy Microanal. 19 (soppl. 2) (2012) 812-813, doi:10.1017/S14311927613006053.Google Scholar
[13] Berger, M.J., Hubbell, J.H., et al., “XCOM:Photon Cross Section Database” (2007) NBS-IR 87-3597, www.nist.gov/pml/data/xcom.Google Scholar