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What Does Quantitative Mean In Atomic-Resolution EDS STEM?

Published online by Cambridge University Press:  23 September 2015

NR Lugg ,
G Kothleitner ,
B Feng ,
N Shibata  and
Y Ikuhara
NR Lugg
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, JAPAN
G Kothleitner
Affiliation:
Institute for Electron Microscopy and Nanoanalysis, Graz University of Technology, Graz, AUSTRIA Centre for Electron Microscopy, Graz, AUSTRIA
B Feng
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, JAPAN
N Shibata
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, JAPAN
Y Ikuhara
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, JAPAN

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1075 - 1076
Copyright
Copyright © Microscopy Society of America 2015 

References

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[10] The authors acknowledge funding from MEXT and the JSPS.Google Scholar