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What are the Limitations in the Characterization of Self-Assembled Metamaterials using Advanced Microscopy Techniques?

Published online by Cambridge University Press:  01 August 2005

C J Kiely ,
M Watanabe ,
A Burrows ,
P Clasen ,
M P Harmer ,
B Rodriguez-Gonzalez ,
L Liz-Marzan ,
I Hussain ,
J Fink  and
M Brust
C J Kiely
Affiliation:
Lehigh University
M Watanabe
Affiliation:
Lehigh University
A Burrows
Affiliation:
Lehigh University
P Clasen
Affiliation:
Lehigh University
M P Harmer
Affiliation:
Lehigh University
B Rodriguez-Gonzalez
Affiliation:
Universidad de Vigo
L Liz-Marzan
Affiliation:
Universidad de Vigo
I Hussain
Affiliation:
Universidad de Vigo
J Fink
Affiliation:
University of Liverpool
M Brust
Affiliation:
University of Liverpool

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 204 - 205
Copyright
© 2005 Microscopy Society of America