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Volume Imaging By Tracking Sparse Topological Features In Electron Micrograph Tilt Series

Published online by Cambridge University Press:  22 July 2022

T. C. Petersen ,
C. Zhao ,
E. D. Bøjesen ,
N. L. N. Broge ,
S. Hata ,
Y. Liu  and
J. Etheridge
T. C. Petersen*
Affiliation:
Monash Centre for Electron Microscopy, Monash University, Clayton, Victoria, Australia
C. Zhao
Affiliation:
Interdisciplinary Nanoscience Centre, Aarhus University, Aarhus, Midtjylland, Denmark
E. D. Bøjesen
Affiliation:
Monash Centre for Electron Microscopy, Monash University, Clayton, Victoria, Australia Interdisciplinary Nanoscience Centre, Aarhus University, Aarhus, Midtjylland, Denmark
N. L. N. Broge
Affiliation:
Interdisciplinary Nanoscience Centre, Aarhus University, Aarhus, Midtjylland, Denmark
S. Hata
Affiliation:
Department of Advanced Materials Science, Kyushu University, Fukuoka, Japan
Y. Liu
Affiliation:
Research School of Chemistry, The Australian National University, Canberra, Acton, Australia
J. Etheridge
Affiliation:
Monash Centre for Electron Microscopy, Monash University, Clayton, Victoria, Australia
*
*Corresponding author: [email protected]

Abstract

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Type
Advanced 3D Imaging and Analysis Methods for New Opportunities in Material Science
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 242 - 244
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Copyright
Copyright © Microscopy Society of America 2022

References

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This work was supported by the Australian Research Council (ARC) via grants LE0454166 and LE170100118, as well as the Japan Society for the Promotion of Science (JSPS)/Ministry of Education, Culture, Sports, Science and Technology (MEXT), Japan KAKENHI (JP18H05479, JP20H02426); Japan Science and Technology Agency (JST) CREST (\#JPMJCR18J4). Bo Brummerstedt Iversen of Aarhus University is thanked for support, along with that of the Villum Foundation. J. Etheridge acknowledges funding from ARC grant DP150104483. Matt Weyland and Laure Bourgeois are thanked for their assistance at the Monash Centre for Electron Microscopy.Google Scholar