Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Armbruster, Barbara
Cable, Michael
Kosmowska, Ewa
Larsen, Kim
Trimby, Patrick
and
Vane, Ronald
2020.
The Benefits of Plasma Cleaning for TKD/EBSD Analysis.
Microscopy and Microanalysis,
Vol. 26,
Issue. S2,
p.
2702.
Farr, Nicholas T. H.
Hughes, Gareth M.
and
Rodenburg, Cornelia
2021.
Monitoring Carbon in Electron and Ion Beam Deposition within FIB-SEM.
Materials,
Vol. 14,
Issue. 11,
p.
3034.