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Virtual Electron Backscatter Diffraction for Multiscale Defect Characterization

Published online by Cambridge University Press:  30 July 2021

Chaoyi Zhu
Affiliation:
Carnegie Mellon University, United States
Dylan Madisetti
Affiliation:
Johns Hopkins University, United States
Jaafar El-Awady
Affiliation:
Johns Hopkins University, United States
Marc De Graef
Affiliation:
Carnegie Mellon University, Pittsburgh, Pennsylvania, United States

Abstract

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Type
Defects in Materials: How We See and Understand Them
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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