Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-23T16:11:17.096Z Has data issue: false hasContentIssue false
  • English
  • Français

Vibrational Spectroscopy of Beam-Sensitive Materials in the Transmission Electron Microscope

Published online by Cambridge University Press:  30 July 2021

Alexander Reifsnyder ,
Songwei Zhang ,
Yiying Wu  and
David McComb
Alexander Reifsnyder
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, USA, Columbus, Ohio, United States
Songwei Zhang
Affiliation:
Department of Chemistry, The Ohio State University, Columbus, OH, USA, United States
Yiying Wu
Affiliation:
Department of Chemistry, The Ohio State University, Columbus, OH, USA, United States
David McComb
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, USA, COLUMBUS, Ohio, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 592 - 594
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Ilett, M. et al. , “Analysis of complex, beam-sensitive materials by transmission electron microscopy and associated techniques,” Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, vol. 378, no. 2186, p. 20190601, Dec. 2020, doi: 10.1098/rsta.2019.0601.CrossRefGoogle Scholar
Berger, M., “What is a MOF (metal organic framework)?,” 16-Sep-2020. [Online]. Available: https://www.nanowerk.com/mof-metal-organic-framework.php.Google Scholar
Krivanek, O. L. et al. , “Vibrational spectroscopy in the electron microscope,” Nature, vol. 514, no. 7521, pp. 209–212, Oct. 2014, doi: 10.1038/nature13870.Google Scholar
Dwyer, C., Aoki, T., Rez, P., Chang, S. L. Y., Lovejoy, T. C., and Krivanek, O. L., “Electron-Beam Mapping of Vibrational Modes with Nanometer Spatial Resolution,” Phys. Rev. Lett., vol. 117, no. 25, p. 256101, Dec. 2016, doi: 10.1103/PhysRevLett.117.256101.Google ScholarPubMed
Krivanek, O. L. et al. , “Progress in ultrahigh energy resolution EELS,” Ultramicroscopy, vol. 203, pp. 60–67, Aug. 2019, doi: 10.1016/j.ultramic.2018.12.006.Google Scholar
The authors acknowledge funding from the Center for Emergent Materials at The Ohio State University, an NSF MRSEC (DMR- 2011876)Google Scholar