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VEELS Study of Boron and Nitrogen Doped Single Layer Graphene

Published online by Cambridge University Press:  23 September 2015

F.S. Hage ,
D.M. Kepaptsoglou ,
T.P. Hardcastle ,
C.R. Seabourne ,
A.J. Scott ,
R. Brydson ,
R. Zan ,
J. Amani ,
H. Hofsass  and
U. Bangert
...Show all authors
F.S. Hage
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, WA4 4AD, U.K.
D.M. Kepaptsoglou
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, WA4 4AD, U.K.
T.P. Hardcastle
Affiliation:
Institute for Materials Research, SCAPE, University of Leeds, Leeds, LS2 9JT, UK
C.R. Seabourne
Affiliation:
Institute for Materials Research, SCAPE, University of Leeds, Leeds, LS2 9JT, UK
A.J. Scott
Affiliation:
Institute for Materials Research, SCAPE, University of Leeds, Leeds, LS2 9JT, UK
R. Brydson
Affiliation:
Institute for Materials Research, SCAPE, University of Leeds, Leeds, LS2 9JT, UK
R. Zan
Affiliation:
Department of Physics, Faculty of Arts and Sciences, Nigde University, Nigde 51000, Turkey
J. Amani
Affiliation:
II Physikalisches Institut, Georg-August-Universitat Gottingen, Friedrich-Hund-Platz 1, 37077 Gottingen, Germany
H. Hofsass
Affiliation:
II Physikalisches Institut, Georg-August-Universitat Gottingen, Friedrich-Hund-Platz 1, 37077 Gottingen, Germany
U. Bangert
Affiliation:
Department of Physics and Energy, University of Limerick, Limerick, Ireland
Q.M. Ramasse
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, WA4 4AD, U.K.

Abstract

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Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 743 - 744
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

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[2] Bangert, U, Pierce, W, Kepaptsoglou, DM, Ramasse, Q, Zan, R, Gass, MH, Van den Berg, JA, Boothroyd, CB, Amani, J & Hofsass, H, Nano Letters 13 (2013). p. 4902.Google Scholar
[3] Xu, Y, Zhang, K, Brusewitz, C, Wu, X & Hofsass, HC, AIP Advances 3 (2013) 072120.Google Scholar
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[6] SuperSTEM is the UK National Facility for aberration-corrected STEM and is funded by the UK Engineering and Physical Sciences Research Council (EPSRC).Google Scholar