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Vector Piezoresponse Force Microscopy

Published online by Cambridge University Press:  16 May 2006

Sergei V. Kalinin ,
Brian J. Rodriguez ,
Stephen Jesse ,
Junsoo Shin ,
Arthur P. Baddorf ,
Pradyumna Gupta ,
Himanshu Jain ,
David B. Williams  and
Alexei Gruverman
Sergei V. Kalinin
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Bldg. 3025, MS 6030, 1 Bethel Valley Rd., Oak Ridge, TN 37831, USA
Brian J. Rodriguez
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Bldg. 3025, MS 6030, 1 Bethel Valley Rd., Oak Ridge, TN 37831, USA Department of Physics, North Carolina State University, 2700 Stinson Drive, Box 8202, Raleigh, NC 27695, USA
Stephen Jesse
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Bldg. 3025, MS 6030, 1 Bethel Valley Rd., Oak Ridge, TN 37831, USA
Junsoo Shin
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Bldg. 3025, MS 6030, 1 Bethel Valley Rd., Oak Ridge, TN 37831, USA Department of Physics and Astronomy, University of Tennessee, 1408 Circle Drive, Knoxville, TN 37996, USA
Arthur P. Baddorf
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Bldg. 3025, MS 6030, 1 Bethel Valley Rd., Oak Ridge, TN 37831, USA
Pradyumna Gupta
Affiliation:
Department of Materials Science and Engineering, Lehigh University, 5 East Packer Avenue, Bethlehem, PA 18015, USA
Himanshu Jain
Affiliation:
Department of Materials Science and Engineering, Lehigh University, 5 East Packer Avenue, Bethlehem, PA 18015, USA Center for Optical Technologies, Lehigh University, 5 East Packer Ave., Bethlehem, PA 18015, USA
David B. Williams
Affiliation:
Department of Materials Science and Engineering, Lehigh University, 5 East Packer Avenue, Bethlehem, PA 18015, USA
Alexei Gruverman
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, 2410 Campus Shore Drive, Raleigh, NC 27695, USA
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Abstract

A novel approach for nanoscale imaging and characterization of the orientation dependence of electromechanical properties—vector piezoresponse force microscopy (Vector PFM)—is described. The relationship between local electromechanical response, polarization, piezoelectric constants, and crystallographic orientation is analyzed in detail. The image formation mechanism in vector PFM is discussed. Conditions for complete three-dimensional (3D) reconstruction of the electromechanical response vector and evaluation of the piezoelectric constants from PFM data are set forth. The developed approach can be applied to crystallographic orientation imaging in piezoelectric materials with a spatial resolution below 10 nm. Several approaches for data representation in 2D-PFM and 3D-PFM are presented. The potential of vector PFM for molecular orientation imaging in macroscopically disordered piezoelectric polymers and biological systems is discussed.

Keywords

scanning probe microscopypiezoresponse force microscopypiezoelectric materialsferroelectric materialsdomainsorientation imaging
Type
MICROSCOPY TECHNIQUES
Information
Microscopy and Microanalysis , Volume 12 , Issue 3 , June 2006 , pp. 206 - 220
Copyright
© 2006 Microscopy Society of America

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References

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