Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Buse, Ben
and
Kearns, Stuart
2018.
Evaluating X-Ray Microanalysis Phase Maps Using Principal Component Analysis.
Microscopy and Microanalysis,
Vol. 24,
Issue. 2,
p.
116.
Pinard, Philippe T.
Burgess, Simon
Hyde, Anthony
Holland, James
and
Statham, Peter
2018.
Joy of Scanning with Electron and X-ray Imaging.
Microscopy and Microanalysis,
Vol. 24,
Issue. S1,
p.
624.