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Valence Electron EELS Spectroscopy on Nanoparticle Surfaces

Published online by Cambridge University Press:  02 July 2020

C. Colliex ,
K. Suenaga ,
M. Kociak  and
O. Stephan
C. Colliex
Affiliation:
Laboratoire de Physique des Solides, Bat. 510, Universite Paris Sud, 91405, Orsay, France
K. Suenaga
Affiliation:
presently at JST-ICORP, Department of Physics, Meijo University, Nagoya, 468-8502, Japan
M. Kociak
Affiliation:
Laboratoire de Physique des Solides, Bat. 510, Universite Paris Sud, 91405, Orsay, France
O. Stephan
Affiliation:
presently at JST-ICORP, Department of Physics, Meijo University, Nagoya, 468-8502, Japan
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Extract

A series of recent experiments, using electron as well as photon probes [1-3], have attracted considerable interest on the importance of surface plasmon modes in nanostructured media such as nanospheres, nanotubes, nanowires, nanopores or nanoholes.

The basic principle for STEM operation had early been recognized to be well suited to the investigation of cases where non penetrating electrons propagate at a given impact parameter from an external surface (along "aloof7 trajectories, using a terminology proposed by Warmack et al. [4]). One of the most spectacular effect is that signals attributed to the excitation of-surface plasmon modes could be detected in vacuum at distances as large as a few tens of nanometers from the outside surface of a specimen, see for instance [5] for the planar geometry and [6], for the spherical one. Most interpretations accounting for the spatial dependence of EELS spectra in the "aloof geometries, rely on models using the bulk dielectric coefficients of the material to describe the induced charges and polarization responsible for the specimen electric field acting on the probe electron and consequently for the measured energy loss.

Type
A. Howie Symposium: Celebration of Pioneering Electron Microscopy
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 668 - 669
Copyright
Copyright © Microscopy Society of America

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References

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