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Utilizing Focused Ion Beam (FIB) and Transmission Electron Microscopy (TEM) for Failure Analysis of Char Deposits Obtained From Space Shuttle Columbia Window Debris
Published online by Cambridge University Press: 08 April 2017
Extract
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
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- Copyright © Microscopy Society of America 2011
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