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Using Bethe Potentials in the Scattering Matrix for Defect Image Simulations

Published online by Cambridge University Press:  27 August 2014

A. Wang  and
M. De Graef
A. Wang
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., Pittsburgh PA 15213, USA
M. De Graef
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., Pittsburgh PA 15213, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1030 - 1031
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Bethe., H.A. Ann. d. Physik 87 (1928), p.55.Google Scholar
[2] Zuo, J.M. and Wieckenmeier, A.L. Ultramicroscopy 57 (1995), p.375.Google Scholar
[3] Research supported the Air Force Office of Scientific Research, MURI contract # FA9550-12-1-0458.Google Scholar