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Using a Focused Ion Beam to Characterize the Microstructure of Porous Lanthanum Strontium Manganite (LSM) Electrodes

Published online by Cambridge University Press:  31 July 2006

A Chen ,
JR Smith ,
RT DeHoff  and
KS Jones
A Chen
Affiliation:
University of Florida
JR Smith
Affiliation:
University of Florida
RT DeHoff
Affiliation:
University of Florida
KS Jones
Affiliation:
University of Florida

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1286 - 1287
Copyright
© 2006 Microscopy Society of America