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Use of spectrum simulation to optimise collection parameters for accurate and efficient WDS and EDS quantitative analyses

Published online by Cambridge University Press:  30 July 2021

Philippe Pinard
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, United Kingdom
Rosie Jones
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, United Kingdom
Simon Burgess
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, England, United Kingdom
Peter Statham
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, United Kingdom

Abstract

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Type
Unresolved Challenges in Quantitative X-ray Microanalysis
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Reed, SJB and Buckley, A, Mikrochim. Acta 13 (1996), 479.Google Scholar
Fournier, C et al. , Mikrochim. Acta 132 (2000), 531.CrossRefGoogle Scholar
Fournier, C et al. , Microsc. Microanal. 7 S2 (2001), 674.CrossRefGoogle Scholar
Burgess, S and Pinard, PT, Microsc. Microanal. 26 (S2) (2019), 114.CrossRefGoogle Scholar
Statham, PJ et al. , IOP Conf. Ser.: Mater. Sci. Eng 109 (2016), 012016.Google Scholar
Love, G and Scott, VD, J. Phys. D 11 (1978), 1369.CrossRefGoogle Scholar
Lin, Y and Joy, DC, Surface and Interface Analysis 37 (2005), 895.CrossRefGoogle Scholar
Reimer, L, “Scanning Electron Microscopy” (2nd), Springer (1998).CrossRefGoogle Scholar
Scott, VD et al. , “Quantitative Electron-Probe Microanalysis” (2nd), Ellis Horwood (1995).Google Scholar