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Use of Partial Scattering EDX Cross-Sections to Quantify Light Elements in the STEM

Published online by Cambridge University Press:  22 July 2022

A.A. Sheader  and
P.D. Nellist
A.A. Sheader*
Affiliation:
University of Oxford, Department of Materials, Oxford, United Kingdom
P.D. Nellist
Affiliation:
University of Oxford, Department of Materials, Oxford, United Kingdom
*
*Corresponding author: [email protected]

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2448 - 2450
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Copyright
Copyright © Microscopy Society of America 2022

References

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The authors acknowledge use of characterization facilities within the David Cockayne Centre for Electron Microscopy, Department of Materials, University of Oxford and in particular the Faraday Institution (FIRG007, FIRG008), the EPSRC (EP/K040375/1 “South of England Analytical Electron Microscope”) and additional instrument provision from the Henry Royce Institute (Grant reference EP/R010145/1).Google Scholar