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The Use of Electron Ptychography to Implement Efficient Phase Imaging in STEM

Published online by Cambridge University Press:  25 July 2016

P D Nellist
Affiliation:
Department of Materials, University of Oxford, Parks Rd, Oxford UK.
H Yang
Affiliation:
Department of Materials, University of Oxford, Parks Rd, Oxford UK.
L Jones
Affiliation:
Department of Materials, University of Oxford, Parks Rd, Oxford UK.
G T Martinez
Affiliation:
Department of Materials, University of Oxford, Parks Rd, Oxford UK.
R N Rutte
Affiliation:
Department of Chemistry, University of Oxford, 12 Mansfield Road, OX1 3TA, Oxford UK.
B D Davis
Affiliation:
Department of Chemistry, University of Oxford, 12 Mansfield Road, OX1 3TA, Oxford UK.
T J Pennycook
Affiliation:
Department of Physics, University of Vienna, Boltzmanngasse 5, 1090 Vienna, Austria.
M Simson
Affiliation:
PNDetector GmbH, SckellstraBe 3, 81667 Miinchen, Germany.
M Huth
Affiliation:
PNDetector GmbH, SckellstraBe 3, 81667 Miinchen, Germany.
H Soltau
Affiliation:
PNDetector GmbH, SckellstraBe 3, 81667 Miinchen, Germany.
L Striider
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring t, 81739 Miinchen, Germany.
R Sa gawa
Affiliation:
JEOL Ltd., 3-1-2 Musashino Akishima Tokyo 196-8558Japan.
Y Kondo
Affiliation:
JEOL Ltd., 3-1-2 Musashino Akishima Tokyo 196-8558Japan.

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

[1] Nellist, P.D., McCallum, B.C. & Rodenburg, J.M. Nature 374 (1995) 630632.Google Scholar
[2] Rodenburg, J.M., McCallum, B.C. & Nellist, P.D. Ultramicroscopy 48 (1993) 303314.Google Scholar
[3] Pennycook, T.J., et al., Ultramicroscopy 151 (2015) 160167.CrossRefGoogle Scholar
[4] Yang, H., et al., Ultramicroscopy 151 (2015) 232239.Google Scholar
[5] The authors acknowledge funding from the EPSRC through grant number EP/M010708/1.Google Scholar