Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Tate, Mark W.
Purohit, Prafull
Chamberlain, Darol
Nguyen, Kayla X.
Hovden, Robert
Chang, Celesta S.
Deb, Pratiti
Turgut, Emrah
Heron, John T.
Schlom, Darrell G.
Ralph, Daniel C.
Fuchs, Gregory D.
Shanks, Katherine S.
Philipp, Hugh T.
Muller, David A.
and
Gruner, Sol M.
2016.
High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy.
Microscopy and Microanalysis,
Vol. 22,
Issue. 1,
p.
237.
Jinschek, Joerg R.
2017.
Achieve atomic resolution in in situ S/TEM experiments to examine complex interface structures in nanomaterials.
Current Opinion in Solid State and Materials Science,
Vol. 21,
Issue. 2,
p.
77.
Nord, Magnus
and
Verbeeck, Johan
2019.
Open Source Development Tools for Robust and Reproducible Electron Microscopy Data Analysis.
Microscopy and Microanalysis,
Vol. 25,
Issue. S2,
p.
138.
Nord, Magnus
and
Verbeeck, Johan
2019.
Towards Reproducible and Transparent Science of (Big) Electron Microscopy Data Using Version Control.
Microscopy and Microanalysis,
Vol. 25,
Issue. S2,
p.
232.
Botton, Gianluigi
and
Prabhudev, Sagar
2019.
Springer Handbook of Microscopy.
p.
345.
Nellist, Peter D.
2019.
Springer Handbook of Microscopy.
p.
49.
O'Leary, Colum M.
Liberti, Emanuela
Collins, Sean M.
Johnstone, Duncan N.
Rothmann, Mathias
Hou, Jingwei
Allen, Christopher S.
Kim, Judy S.
Bennett, Thomas D.
Midgley, Paul A.
Kirkland, Angus I.
and
Nellist, Peter D.
2019.
Electron Ptychography Using Fast Binary 4D STEM Data.
Microscopy and Microanalysis,
Vol. 25,
Issue. S2,
p.
1662.
Deb, Pratiti
Cao, Michael C.
Han, Yimo
Holtz, Megan E.
Xie, Saien
Park, Jiwoong
Hovden, Robert
and
Muller, David A.
2020.
Imaging Polarity in Two Dimensional Materials by Breaking Friedel's Law.
Ultramicroscopy,
Vol. 215,
Issue. ,
p.
113019.
Nord, Magnus
Webster, Robert W. H.
Paton, Kirsty A.
McVitie, Stephen
McGrouther, Damien
MacLaren, Ian
and
Paterson, Gary W.
2020.
Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part I: Data Acquisition, Live Processing, and Storage.
Microscopy and Microanalysis,
Vol. 26,
Issue. 4,
p.
653.
Firoozabadi, S.
Kükelhan, P.
Hepp, T.
Beyer, A.
and
Volz, K.
2021.
Optimization of imaging conditions for composition determination by annular dark field STEM.
Ultramicroscopy,
Vol. 230,
Issue. ,
p.
113387.
Zuo, Jian-Min
Yuan, Renliang
Shao, Yu-Tsun
Hsiao, Haw-Wen
Pidaparthy, Saran
Hu, Yang
Yang, Qun
and
Zhang, Jiong
2022.
Data-driven electron microscopy: electron diffraction imaging of materials structural properties.
Microscopy,
Vol. 71,
Issue. Supplement_1,
p.
i116.
Gao, Zirui
Li, Aowen
Ma, Ding
and
Zhou, Wu
2022.
Electron Energy Loss Spectroscopy for Single Atom Catalysis.
Topics in Catalysis,
Vol. 65,
Issue. 17-18,
p.
1609.