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Understanding the In-Situ Reaction of Cerium Oxide Nanoparticles Using Aberration Corrected Exit Wave Restoration and EELS

Published online by Cambridge University Press:  09 April 2017

S Haigh ,
N Young ,
H Sawada ,
K Takayanagi  and
A Kirkland
S Haigh
Affiliation:
University of Manchester, United Kingdom
N Young
Affiliation:
University of Oxford, United Kingdom
H Sawada
Affiliation:
JEOL Ltd, Japan
K Takayanagi
Affiliation:
Tokyo Institute of Technology, Japan
A Kirkland
Affiliation:
University of Oxford, United Kingdom

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1592 - 1593
Copyright
Copyright © Microscopy Society of America 2011