Hostname: page-component-7bb8b95d7b-wpx69 Total loading time: 0 Render date: 2024-10-06T13:26:24.236Z Has data issue: false hasContentIssue false
  • English
  • Français

Understanding the Growth Mechanism of β-(AlxGa1−x)2O3 by Atom Probe Tomography

Published online by Cambridge University Press:  05 August 2019

Jith Sarker ,
Yuewei Zhang ,
Menglin Zhu ,
Siddharth Rajan ,
Jinwoo Hwang  and
Baishakhi Mazumder
Jith Sarker
Affiliation:
Department of Materials Design and Innovation, University at Buffalo-SUNY, Buffalo, NY, USA.
Yuewei Zhang
Affiliation:
Department of Electrical and Computer Engineering, Ohio State University, Columbus, OH, USA.
Menglin Zhu
Affiliation:
Department of Materials Science and Engineering, Ohio State University, Columbus, OH, USA.
Siddharth Rajan
Affiliation:
Department of Electrical and Computer Engineering, Ohio State University, Columbus, OH, USA.
Jinwoo Hwang
Affiliation:
Department of Materials Science and Engineering, Ohio State University, Columbus, OH, USA.
Baishakhi Mazumder*
Affiliation:
Department of Materials Design and Innovation, University at Buffalo-SUNY, Buffalo, NY, USA.
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
New Frontiers in Atom Probe Tomography Applications
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2508 - 2509
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Krueger, B.W. et al. , J. Am. Ceram. Soc., 99 (2016), p. 2467.Google Scholar
[2]Kelly, T. F. and Larson, D. J., Annu. Rev. Matter. Res., 42, (2012), p. 1.Google Scholar
[3]Luong, T.T. et al. , Microelectronics Reliability 83 (2018), p. 286.Google Scholar