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Understanding Ferroelectricity in Nanometric Sodium Niobate by Differential Phase Contrast

Published online by Cambridge University Press:  30 July 2021

Beatriz Canabarro
Affiliation:
Federal University of Rio de Janeiro, Rio de Janeiro, Rio de Janeiro, Brazil
Sebastian Calderon
Affiliation:
International Iberian Nanotechnology Laboratory, Braga, Portugal
Paulo Ferreira
Affiliation:
International Iberian Nanotechnology Laboratory, United States
Paula Jardim
Affiliation:
Federal University of Rio de Janeiro, Rio de Janeiro, Rio de Janeiro, Brazil

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Shibata, N., Findlay, S.D., Kohno, Y., Sawada, H., Kondo, Y., Ikuhara, Y., Differential phase-contrast microscopy at atomic resolution, Nat. Phys. 8 (2012) 611615. doi:10.1038/nphys2337.CrossRefGoogle Scholar
Brown, H.G., Shibata, N., Sasaki, H., Petersen, T.C., Paganin, D.M., Morgan, M.J., Findlay, S.D., Measuring nanometre-scale electric fields in scanning transmission electron microscopy using segmented detectors, Ultramicroscopy. 182 (2017) 169178. doi:10.1016/j.ultramic.2017.07.002.CrossRefGoogle ScholarPubMed
Shibata, N., Atomic-resolution differential phase contrast electron microscopy, J. Ceram. Soc. Japan. 127 (2019) 708714. doi:10.2109/jcersj2.19118.CrossRefGoogle Scholar
Campanini, M., Eimre, K., Bon, M., Pignedoli, C.A., Rossell, M.D., Erni, R., Atomic-resolution differential phase contrast STEM on ferroelectric materials: A mean-field approach, Phys. Rev. B. 101 (2020) 184116. doi:10.1103/PhysRevB.101.184116.CrossRefGoogle Scholar
Nakamura, A., Kohno, Y., Sasaki, H., Shibata, N., Differential Phase Contrast Imaging with Reduced Dynamical Diffraction Effect, Microsc. Microanal. 23 (2017) 14121413. doi:10.1017/S1431927617007723.CrossRefGoogle Scholar
Haas, B., Rouvière, J.L., Boureau, V., Berthier, R., Cooper, D., Direct comparison of off-axis holography and differential phase contrast for the mapping of electric fields in semiconductors by transmission electron microscopy., Ultramicroscopy. 198 (2019) 5872. doi:10.1016/j.ultramic.2018.12.003.CrossRefGoogle ScholarPubMed
Barthel, J., Dr. Probe: A software for high-resolution STEM image simulation, Ultramicroscopy. 193 (2018) 111. doi:10.1016/j.ultramic.2018.06.003.Google ScholarPubMed
Lazić, I., Bosch, E.G.T., Lazar, S., Phase contrast STEM for thin samples: Integrated differential phase contrast, Ultramicroscopy. 160 (2016) 265280. doi:10.1016/j.ultramic.2015.10.011.CrossRefGoogle ScholarPubMed