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Uncertainties in Secondary Fluorescence Correction in EPMA
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
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- Copyright © Microscopy Society of America 2019
References
[2]Reed, S J B, Electron Microprobe Analysis, 2nd ed. (Cambridge University Press, 1993)Google Scholar
[5]Pouchou, J-L and Pichoir, F in “Electron Beam Quantitation”, ed. Heinrich, K F J and Newbury, D E, (Plenum Press, New York), p. 31.Google Scholar
[6]Bastin, G F, Dijkstra, J M and Heijligers, H J M, X-ray Spectrometry 27 (1998), p. 3.Google Scholar
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