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Turn-Key Compressed Sensing System for Electron Microscopy

Published online by Cambridge University Press:  22 July 2022

E.L. Principe ,
J.J. Hagen ,
B.W. Kempshall ,
K.E. Scammon ,
Z. Russel ,
M. Therezien ,
T. McIntee ,
S. DiDona  and
A. Stevens
E.L. Principe*
Affiliation:
Synchrotron Research, Inc., Melbourne Beach, Florida, USA
J.J. Hagen
Affiliation:
Synchrotron Research, Inc., Melbourne Beach, Florida, USA
B.W. Kempshall
Affiliation:
PanoScientific, LLC 2, Cocoa, Florida, USA
K.E. Scammon
Affiliation:
PanoScientific, LLC 2, Cocoa, Florida, USA
Z. Russel
Affiliation:
Ion Innovations3, Boone, North Carolina, USA
M. Therezien
Affiliation:
Ion Innovations3, Boone, North Carolina, USA
T. McIntee
Affiliation:
Ion Innovations3, Boone, North Carolina, USA
S. DiDona
Affiliation:
Ion Innovations3, Boone, North Carolina, USA
A. Stevens
Affiliation:
Optimal Sensing, Southlake, Texas, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2516 - 2518
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Copyright
Copyright © Microscopy Society of America 2022

References

SB1341-15-CN-0050, SB1341-16-SE-0203, SB1341-17-CN-0029Google Scholar
Anderson, , et al. , Computational Imaging X1. Proceedings of SPI-IS&T Electronic Imaging, SPIE. 8675 (2013).Google Scholar
Kovarik, L. et al. , Appl. Phys. Lett. 109 (2016), p. 164102. https://doi.org/10.1063/1.4965720.CrossRefGoogle Scholar