Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-26T16:25:52.139Z Has data issue: false hasContentIssue false
  • English
  • Français

Tuning High Order Geometric Aberrations in Quadrupole-Octupole Correctors

Published online by Cambridge University Press:  27 August 2014

N. Dellby ,
G.J. Corbin ,
Z. Dellby ,
T.C. Lovejoy ,
Z.S. Szilagyi ,
M.F. Chisholm  and
O.L. Krivanek
N. Dellby
Affiliation:
Nion Co., 1102 Eighth St, Kirkland, WA 98033, USA
G.J. Corbin
Affiliation:
Nion Co., 1102 Eighth St, Kirkland, WA 98033, USA
Z. Dellby
Affiliation:
Nion Co., 1102 Eighth St, Kirkland, WA 98033, USA
T.C. Lovejoy
Affiliation:
Nion Co., 1102 Eighth St, Kirkland, WA 98033, USA
Z.S. Szilagyi
Affiliation:
Nion Co., 1102 Eighth St, Kirkland, WA 98033, USA
M.F. Chisholm
Affiliation:
Materials Science and Technology Division, Oak Ridge National Lab., Oak Ridge, TN 37831, USA
O.L. Krivanek
Affiliation:
Nion Co., 1102 Eighth St, Kirkland, WA 98033, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 928 - 929
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Haider, M, et al., Ultramicroscopy108 (2008) 167-178.Google Scholar
[2] Kieslowski, C, et al., Microsc. Microanal. 14 (2008) 469–477.Google Scholar
[3] Krivanek, OL, et al., Microscopy 62 (2013) 3–21.Google Scholar
[4] Dellby, N, Krivanek, OL andMurfitt, MF Phys. Procedia 1 (2008) 179-180.Google Scholar
[5] Sawada, H, et al., Micron, in press (2014) http://dx.doi.org/10.1016/j.micron.2014.01.007.Google Scholar
[6] Krivanek, OL, Dellby, N and Murfitt, MF in: Handbook of Charged Particle Optics (2nd edition),(Orloff J., ed. Boca Raton: CRC Press, 2009) 601-640.Google Scholar
[7] Shao, Z, Beck, V and Crewe, AV J. Appl. Phys. 64 (1988) 1646-1651.Google Scholar
[8] MFC is supported by the U.S. DOE, Basic Energy Sciences, MSE Division.Google Scholar
[9] YAlO3 sample courtesy Scintillation Materials Research Center at the University of Tennessee.Google Scholar