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Trinity Detection System for SEM and FIB/SEM.

Published online by Cambridge University Press:  05 August 2019

Petr Wandrol
Petr Wandrol*
Affiliation:
Thermo Fisher Scientific, Materials & Structural Analysis, Brno, Czech Republic
*
*Corresponding author: [email protected]

Abstract

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Type
Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 458 - 459
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Wall, D et al. , Microscopy and Microanalysis 20 (2014), p. 1102Google Scholar
[2]Wandrol, P et al. , Microscopy and Microanalysis 22 (2016), p. 576Google Scholar
[3]Images courtesy of T. Kazda, Brno University of Technology.Google Scholar