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Transmission Electron Microscopy Study of Y2O3 Nanotips Grown on LaAlO3

Published online by Cambridge University Press:  02 July 2020

H.P. Sun ,
D.B. Jan ,
Q.X. Jia  and
X.Q. Pan
H.P. Sun
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, 48109
D.B. Jan
Affiliation:
The Superconductivity Technology Center, Los Alamos National Laboratory, NM, 87545
Q.X. Jia
Affiliation:
The Superconductivity Technology Center, Los Alamos National Laboratory, NM, 87545
X.Q. Pan
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, 48109
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Abstract

Y2O3 is a super refractory oxide with high thermal stability and finds various applications in optics and microelectronic devices. Recently, Eu-activated Y2O3 films attracted much research interest due to its promising applications in flat panel field emission displays. Epitaxial Y2O3:Eu thin films have been grown on LaA1O3(LAO). in this paper we report a transmission electron microscopy (TEM) study of Y2O3 nano tip-structure grown on LAO by pulsed laser deposition using stoichiometric YBa2Cu3O7-σ.a target under a low oxygen pressure. The experimental work was conducted within a JEOL2010F TEM equipped with an ED AX system.

Fig.l is a low magnification cross-section TEM image of the nano-tip structure grown on (001) LAO. The lattice parameters of the tips were calculated to be that of Y2O3 by using LAO as a standard for indexing the diffraction patterns. Nano electron beam diffraction patterns from the tips along [100] and [110] axis are shown in Fig.2a and Fig.2b, respectively, in agreement with the simulated ones using bulk Y2O3 structure.

Type
Applications of Microscopy: Surfaces/Interfaces
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 320 - 321
Copyright
Copyright © Microscopy Society of America 2001

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References

References:

1.Gao, H-J., et al. Appl. Phys. Lett. 75 (1999) 223.Google Scholar
2.Kumar, D., et al. Phys. Rev. B60 (1999) 13331.CrossRefGoogle Scholar
3.Jollet, F. et al. Phys. Rev. B42 (1990) 7587.CrossRefGoogle Scholar