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Transmission Electron Diffraction Investigation of White Etching Areas in Bearing Steels: A Comparison Between TKD and TEM

Published online by Cambridge University Press:  27 August 2014

Dandan Wu ,
Amir Avishai ,
Vikram Bedekar ,
Scott Hyde  and
Arthur Heuer
Dandan Wu
Affiliation:
Timken Technology Center, 4500 MT Pleasant Rd NW, N Canton, OH, 44720
Amir Avishai
Affiliation:
Swagelok Center for Surface Analysis of Materials, Case Western Reserve University, Cleveland, OH, 44106
Vikram Bedekar
Affiliation:
Timken Technology Center, 4500 MT Pleasant Rd NW, N Canton, OH, 44720
Scott Hyde
Affiliation:
Timken Technology Center, 4500 MT Pleasant Rd NW, N Canton, OH, 44720
Arthur Heuer
Affiliation:
Swagelok Center for Surface Analysis of Materials, Case Western Reserve University, Cleveland, OH, 44106 Dept. of Mat. Sci. and Eng., Case Western Reserve University, Cleveland, OH, 44106

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1476 - 1477
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Evans, M.H. Material Science and Technology, Vol 28, No 1 (2012). pp 3-22.Google Scholar
[2] Bedekar, V. M., Hyde, R. Scott and Shivpuri, Rajiv Microscopy and Microanalysis, 18, Supplement S2, July (2012), p 1778.Google Scholar
[3] Trimby, P.W., et al., Acta Materialia, 62 (2014) p, 69.Google Scholar
[4] Avishai, A., Carter, J., Azar, M. Z., Narayanan, B., and Heuer, A. H. Microscopy and Microanalysis, 19, Supplement S2, Aug (2013), p 694.Google Scholar
[5] The authors would like to acknowledge the technical staff of both FEI and Oxford Instruments for many useful discussions and contributions to this work.Google Scholar